Materials Lab XM

Materials Lab XM

• Impedance range from 1 mOhm to 1 TOhm (1E15 Range)
• Small footprint and application-focus design
• Auxiliary measurement port for synchronized measurement of optical, mechanical or other transducers.
• Instant switching between time Domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measurements without changing sample connections
• Low frequency to 10 µHz for degradation, trap state and material purity studies
• XM-Studio software is included with all XM Series systems
• Materials Lab XM impedance accuracy contour plot highlights Solartron's best in class measurement performance.

Our line of Materials Test Systems test combined electrical, thermal, and mechanical properties of dielectrics, insulators and electronic materials.  These systems include specialized accessories:  High Voltage Amplifiers, Cryostats, Furnaces, and Sample Holders for liquids, powders, and solid materials.

The Materials Lab XM users the same XM based platform to deliver ModuLab performance to a focused application, the study of Materials.  This focused design allows this instrument to occupy a small footprint. ModuLab software includes integrated equivalent circuit analysis, MultiSine and Harmonic Analysis for non-linear materials.  

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