EXFO OPAL-MD - AUTOMATED PIC TEST

OPAL-MD – Multi-die test station

AUTOMATED TEST STATION FOR INTEGRATED PHOTONICS

The OPAL-MD multi-die test station provides high performance characterization for integrated photonics with accurate, repeatable, flexible and fast hardware. The PILOT software suite enhances the OPAL-MD hardware capabilities to provide an automated testing station and a source of quality measurements that can be turned into actionable data. The complete suite of applications is a platform that supports the full test-and-measurements flow and helps users to become more data-driven. Combined with EXFO’s advanced optical measurement capabilities and open to any third-party instrument, the OPAL-MD is a complete platform for PIC testing.

Applications:

• From R&D, design verification and process development to pilot production
• Automated testing of multiple singulated dies from multi-project wafer run
• In-depth analysis of statistical circuit performance and yield
• Opto-electronic testing on any integrated photonic platform: silicon photonics, indium phosphide, III-V, polymer, heterogeneous, etc.  
• Application-agnostic: telecom & datacom transceivers, quantum, LIDAR, sensors, AI, etc.

EXFO website