Triple-Axis Nanopositioners (Shallow Z-motion)
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- Model: nPoint Triple-Axis Nanopositioners (Shallow)
XYZ nanopositioning piezo stages with shallow Z-motion
nPoint Triple Axis Nanopostioners (Up to 35 µm Z-motion)
This range of nPoint 3-axis piezo stages have up to 35 µm of open loop Z-motion, and incorporate a unique flexure-guided design to ensure high resonant frequencies while minimising orthogonality and cross-talk errors.
nPoint's nanopositioners are especially designed for numerous motion critical applications. These include scanning and position control in nanolithography, atomic force microscopy (AFM), biophysics, and optical focusing.
Flexible DSP controllers enable easy optimisation and configuration of piezo systems for a variety of applications.
Standard stage materials are listed. Other materials, including invar, super invar, stainless steel, titanium, and aluminum, are available for some stages. UHV configurations are also available in most products. Please enquire if interested in these options.
XYZ Models | NPXY100 Z10-128 |
NPXY200 Z10-269 |
NPXY50 Z20-477 |
NPXY60 Z20-257 |
< 35 µm of open loop Z-motion | ||||
Key features: | For microscopy Large aperture |
For scanning Large aperture |
For AFM etc. Compact |
Non-magnetic UHV compatible |
Footprint (mm) | 140 x 140 | 140 x 140 | 60 x 60 | 70 dia. |
Height (mm) | 30 | 30 | 31 | 30 |
Aperture (mm) | 68 x 68 | 68 x 68 | None | 20 dia. |
Body Material | Aluminium | Stainless Steel | Aluminium | |
Maximum Load (kg) | 5 | 5 | 1 | 1 |
Stage Mass (kg) | 0.87 | 0.96 | 0.37 | |
Max Push/Pull Force (N) | 100/20 | 100/20 | 100/10 | |
Closed-loop Travel (µm) X- & Y-axes: Z-axis: |
100 10 |
200 10 |
50 20 |
60 20 |
Open-loop Travel* (µm) X- & Y-axes: Z-axis: |
160 15 |
240 15 |
65 35 |
|
Position Noise (nm) X- & Y-axes Z-axis |
0.3 0.1 |
0.7 0.1 |
0.2 0.1 |
0.4 0.2 |
Stiffness (N/µm) X- & Y-axes Z-axis |
3.0 6.2 |
2.8 2.8 |
3 14 |
|
Resonant Freq. (kHz) X-axis Y-axis Z-axis |
0.60 0.60 0.90 |
0.40 0.45 0.90 |
1.20 1.20 2.00 |
0.75 0.75 2.00 |
Linearity Deviation (%) X- & Y-axes Z-axis |
0.01 0.02 |
0.01 0.02 |
0.01 0.10 |
0.03 0.05 |
Settling Time (ms) X- & Y-axes Z-axis |
10 5 |
15 5 |
4 2 |
5 2 |
Capacitance (µF) X- & Y-axes Z-axis |
4.8 1.0 |
7.5 1.0 |
2.8 1.6 |
2 |
Integrated Sensor | Capacitive | |||
Controller | LC.403 | |||
Notes | * Open-loop Travel operating at -30 to 150 V |
XYZ Models | NPXY100 Z25-102 |
NPXY100 Z25-264 |
NPXY200 Z25-103 |
NPXY200 Z25-260 |
35 µm of open loop Z-motion | ||||
Key features: | For metrology Ultra-precise |
For scanning Large aperture |
For microscopy Large aperture |
For metrology Ultra-precise |
Footprint (mm) | 100 x 100 | 140 x 140 | 100 x 100 | 140 x 140 |
Height (mm) | 35 | |||
Aperture (mm) | 38 dia. | 68 x 68 | 38 dia. | 68 x 68 |
Body Material | Aluminium | |||
Maximum Load (kg) | 1 | 1 | 1 | 5 |
Stage Mass (kg) | 0.56 | 0.56 | 0.96 | |
Max Push/Pull Force (N) | 100/10 | 100/20 | 100/20 | |
Closed-loop Travel (µm) X- & Y-axes: Z-axis: |
100 25 |
100 25 |
200 25 |
200 25 |
Open-loop Travel* (µm) X- & Y-axes: Z-axis: |
130 35 |
270 35 |
240 35 |
|
Position Noise (nm) X- & Y-axes Z-axis |
0.3 0.1 |
0.3 0.2 |
0.5 0.1 |
0.7 0.2 |
Stiffness (N/µm) X- & Y-axes Z-axis |
1.3 15.5 |
0.5 13.1 |
2.8 2.7 |
|
Resonant Freq. (kHz) X- & Y-axis Z-axis |
0.50 1.60 |
0.60 0.75 |
0.35 1.60 |
0.45 0.75 |
Linearity Deviation (%) X- & Y-axes Z-axis |
0.01 0.04 |
0.02 0.02 |
0.01 0.04 |
0.01 0.02 |
Settling Time (ms) X- & Y-axes Z-axis |
8 3 |
10 5 |
15 2 |
15 5 |
Capacitance (µF) X- & Y-axes Z-axis |
4.8 3.1 |
7.5 3.1 |
7.5 1.9 |
|
Integrated Sensor | Capacitive | Capacitive | ||
Controller | LC.403 | |||
Notes | * Open-loop Travel operating at -30 to 150 V |
File Name | Size | Link |
---|---|---|
Terms and Conditions V6 | 207.42KiB | Download |
A number of papers have been published by scientists around the globe who have used nPoint stages within their research. Here are some examples:
- Continuous scanning mode for ptychography
- Effect of proteoglycans at interfaces as related to location, architecture, and mechanical cues
- nDSE Based Overlay Alignment: Enabling Technology for Nano Metrology and Fabrication
- OMNY—A tOMography Nano crYo stage
- A Discrete-Time Single-Parameter Combined Feedforward/Feedback Adaptive-Delay Algorithm With Applications to Piezo-Based Raster Tracking